Logo der Universität Wien

Statistical Analysis of Multi-Material Components using Dual Energy CT


This work describes a novel method for statistical analysis of multi-material components. The application scenario is industrial 3D X-ray computed tomography, emphasizing metrology of artefact affected plastics-metal components. The presented work makes use of dual energy CT data acquisition for artefact reduction, in order to optimize CT scans of multi-material components. Using statistical analysis, information on uncertainty is introduced, which allows detailed characterizations of single materials as well as material interfaces. The major contribution of this paper is the development of a specific pipeline based on the dual exposure technique of dual energy CT. After prefiltering and multi-scan fusion, the statistical analysis step computes probability volumes of the fused data using a local histogram analysis technique. The application areas as well as the achieved precision of the presented method are depicted using a test specimen and a real world component.

Grafik Top
Grafik Top
Supplemental Material
Paper in Conference Proceedings or in Workshop Proceedings (Full Paper in Proceedings)
Event Title
VMV 2008, Vision, Modeling and Visualization
Visualization and Data Analysis
Event Location
Konstanz, Deutschland
Event Type
Event Dates
October 8 - 10, 2008
Page Range
pp. 179-188
October 2008
Official URL
Grafik Top
Contact us
Faculty of Computer Science
University of Vienna

Währinger Straße 29
A-1090 Vienna